Tel: 02692 234966 | Mail: sicart_cvm@hotmail.com
Sophisticated Analytical Instruments Facility(SAIF)Supported by Department of Science & Technology(Govt.of India)
Managed by CHARUTAR VIDYA MANDAL
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Specifications:
Description: 4Kw, WD-XRF Basic system
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Description:
Wavelength Dispersive X-ray Fluorescence (WD-XRF) is an analytical method to determine the elemental composition of all kinds of materials. The materials that can be analyzed are solids, liquids, powders and filters. WD-XRF is fast, accurate, non-destructive and usually require minimum sample preparation. WD-XRF can analyze elements from Beryllium to Uranium and from trace levels to 100% levels. |
Applications:
WROXI (Wide Range Oxides Module) oxides and their concentration ranges (wt %): Pre-calibration package for wide variety of oxides, sulphates, phosphates, silicates, rocks, soil and geological and mining samples. TOXEL(Toxic Elements Module):
Pre-calibration package for wide variety of oxides, sulphates, phosphates, silicates, rocks, soil and geological and mining samples OMNIAN SOFTWARE :( Standard less Software): Complete composition of most types of unknown materials can be quantified with a single calibration program. Calibration set up with a selected range of reference materials to calibrate the instrument response covers all common elements that can be measured by XRF: by default O-U. Makes use of (a form of) Fundamental Parameter (FP) calculations to correct for all sample-matrix specific properties.
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