Tel: 02692 234966 | Mail: sicart_cvm@hotmail.com
Sophisticated Analytical Instruments Facility(SAIF)Supported by Department of Science & Technology(Govt.of India)
Managed by CHARUTAR VIDYA MANDAL
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Description:
XRD Diffractometer (powder) Philips Xpert MPD Range (2θ): 3º to 136º; X-ray tube: Cu; JCPDF database; 2θ vs intensity plots/X-ray diffractograms; search match facility with JCPDF data for qualitative
analysis. X’PERT MPD is specifically designed for powder diffractometery. X-ray Diffractometers that are commonly referred as XRD are quite useful for study of crystalline nature of materials. X-Ray analysis technique is a non-destructive testing method Useful instrument for research work and analysis of various types of materials like Powder Analysis, Texture Analysis, Stress Analysis, High Resolution Analysis. |
Specifications: Source: Cu target X-Ray tube X-Ray Power: 2KW Detector: Xe-filled Counterate or Proportional detector Software: JCPDF database for powder diffractometry Goniometer Operation Modes: Vertical & Horizontal Accuracy: ±0.0025 2º θMeasurement range: 3o to 136º Diffractometer radius: 130 to 230 mm |
X-ray diffraction is widely used to identify crystalline phases, measure crystallite sizes, lattice parameters,
orientation and provide quantitative phase analysis and atomic coordinates. This information is important
for relating the production of a material to its structure and hence its properties. As well as being of
academic interest, X-ray results are used in patent disputes, forensically and for quality control.
Compound Identification areas:
Inorganic Materials Organic Materials Minerals Metal + Alloys Forensic Material Zeolites Explosive Materials Super conducting Material Cement Materials Correction Product Polymer Material Detergent Product Pigments Pharmaceutical Product Ceramic Materials Kidney Stones |
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