Model:Talos F200i S/TEM (HRTEM-200KV)
Make:Thermo Fisher Scientific

The Thermo Scientific Talos F200i S/TEM is newest 200KV transmission electron microscope for high resolution imaging and analysis applications.
The Talos F200i S/TEM is 20-200 kV field emission (Scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of material science samples and applications.
Designed for multi-user and multi-discipline environments and equipped with the thermo Scientific ”Velox” user interface that is immediately familiar since it is shared across all Thermo scientific TEM platforms, the Talos F200i S/TEM is also ideal for novice users. All TEM daily tunings have been automated to provide the best and most reproducible setup.
This automation eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time to data for the experienced operator.
The 4K X 4K Ceta aCMOS camera with large field-of-view enables live digital zooming with high sensitivity and high speed over the entire high-tension range.
Model Talos F200i S/TEM (HRTEM-200KV)
Make Thermo Fisher Scientific
Accelerating Voltage 200KV
Electron Source Schottky Field emitter (Field Emission Gun)
Resolution Line Resolution 0.10 nm Point Resolution less than 0.25 nm or less
Magnification TEM Magnification 50x to 1Mx STEM Magnification: 310X to 330Mx
Diffraction Mode Diffraction Mode camera length 14 to 5700MM (1400 M in LAD)
STEM Detector High Angle Annular Dark Field Detector (HAADAF) STEM Resolution less than 0.16nm. STEM Magnification up to 330 Mx
EDS or EDAX Bruker X Flash 6 30 EDS Detector Quantitative Elemental analysis and elemental Mapping Facility.
Sample Holder Single Tilt Holder Low-background Double tilt Holder
Camera 4K X 4K Ceta 16M Camera
Nano Science and Nano Technology. Study of biological micro organisms. Particle Size measurement
Pharmaceutical Science Single crystal Diffraction Virus & Bacterial study.
Thin films Polymer science Catalysis
Talos F200i S/TEM Morphology, crystal structure, interface structure, crystal defects can be studied.