Model:Tecnai 20
Make:Philips, Holland
Specifications:
Applications:
| Electron Source:- W emitter and LaB | Accelerating Voltage:- 200 kv |
| Objective lens:- S- TWIN | Point Resolution: 0.27 nm or better |
| Line Resolution : 2.0 nm or better | Magnification : 25x to 750000x or higher |
| Single tilt holder with CCD Camera |
| Morphology, crystal structure, interface structure, crystal defects can be studied | Study of biological micro organisms. |
| Particle Size measurement | Liposomes |
| Single crystal Diffraction | Virus & Bacterial study |
| Transmission Electron Microscope is highly advanced and state-of-the-art instrument. |
| It uses electron beam optics to achieve very high magnifications of the order of 750,000x |
| It collects a wide range of signals carrying valuable information. Tecnai 20 has been especially designed to acquire and process these signals efficiently and effectively. |
| The combination of high-resolution imaging, bright field, dark field, electron diffraction and detailed microanalysis makes the Tecnai 20 a key to material analysis. |
| Tecnai 20 has S-TWIN objective lens for high resolution, while maintaining high tilts (maximum 40° ) and a Comp Stage for accurate specimen control and exceptional mechanical stability. |
| The fundamental understanding of a material’s properties starts with a thorough characterization of the material morphology, crystal structure, interface structure, surfaces and defects all have their influence on the properties of material. Transmission Electron Microscope has proven to be a very powerful technique for studying a range of general and advanced materials down to the nm level. |